A low-overhead method of embedded software profiling
Liu Fagui, Li Shengwen, Ran Xie, Chunwei Luo · 2009
With the continuous development of embedded technology, embedded applications are becoming increasingly popular in daily lives, and respectively embedded software is in great demand. As a result, how to profile embedded software to guarantee its quality becomes a focus of attention. This paper focuses on this issue. It analyzes current methods of embedded software profiling and their defects, and then proposes a low-overhead and more accurate method. It also performs some strict experiments to prove that it is effective and much better than current methods.