Multiple fault diagnosis in logic circuits using EB tester and multiple/single fault simulators
Hiroshi Takahashi, K. O. Boateng, N. Yanagida, Yuzo Takamatsu · 2003
In this paper, we propose a method that uses an EB tester and multiple/single fault simulators to diagnose multiple stuck-at faults in combinational circuits. Based on the primary output values and selected internal line values which are calculated by multiple/single fault simulators, faults are added to or removed from a set of suspected faults. The proposed method repeats additions and removals of faults to avoid missing actual faults in a faulty circuit. In order to reduce the number of lines to be probed by the EB tester, the proposed method selects internal lines to be probed by using a backward path tracing procedure. The experimental results show that the proposed method achieves a small number of suspected faults by probing a small number of internal lines.