Measurements of transient thermal impedance of MESFETs
Damian Bisewski, Janusz Zarebski · International Conference on Modern Problems of Radio Engineering, Telecommunications and Computer Science · 2008
In the paper a computer-aided method of measuring of the transient thermal impedance of MESFETs is presented. The advantages of this method are illustrated by means of measurements of the gallium arsenide MESFET operating at the different cooling conditions.