A Quantitative Approach for Analysis of Defect Tolerance in QCA
Jianwei Dai, Lei Wang, F. Jain · 2008
Quantum dot cellular automata (QCA) is one of the emerging nanotechnologies for the design of next generation nanocomputing systems. However, excessive defects at the device level are expected to become a fundamental obstacle for achieving reliable computation in QCA-based integrated systems. In this paper, we present an information-theoretic approach to investigate the relationship between defect tolerance and the redundancy inherent in QCA systems. The proposed method allows us to evaluate the effectiveness of redundancy-based defect tolerance in a quantitative manner.