On the use of hard faults to generate test sets
Ioannis Voyiatzis, Costas Efstathiou · 2015
In test set embedding Built-In Self-Test (BIST) schemes a pre-computed test set is embedded into the sequence generated by a hardware module. In this work we first apply a sequence of pseudorandom patterns and then try to embed patterns for the remaining faults (i.e. "extremely hard" faults) in the sequence generated by the hardware generator.