Tests and measurement
Michael J. Riezenman · IEEE Spectrum · 1996
Fuelled by worldwide semiconductor sales, the test and measurement industry in 1995 enjoyed a year like few others in living memory. This paper presents an overview of test and measurement technologies and highlights: industry searches for the best testability strategy; methods to probe dense integrated circuit boards and wafers; standard approval for a system-level test bus; and how the equipment community is tackling software testing.