Constraint satisfaction for test program generation
Daniel R. Lewin, Laurent Sébastien Fournier, Moshe Levinger, E. Roytman, Gil Shurek · 2002
A central problem in automatic test generation is solving constraints for memory access generation. A framework, and an algorithm that has been implemented in the Model-Based Test-Generator are described. This generic algorithm allows flexibility in modeling new addressing modes with which memory accesses are generated. The algorithm currently handles address constraint satisfaction for complex addressing modes in the PowerPC, x86, and other architectures.>