On the over-specification problem in sequential ATPG algorithms
Kwang-Ting Tim Cheng, H.-K.T. Ma · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993
Most sequential ATPG (automatic test pattern generation) programs employ the time-frame expansion technique. Within a time-frame, combinational test generation algorithms that are variations of D-algorithm or PODEM are used. Here, it is shown that some ATPG programs may err in identifying untestable faults. In other words, these test generators may not be able to find the test sequence for a testable fault, even allowed infinite run time, and furthermore may mistakenly claim it as untestable. The main problem of these programs is that the underlying combinational test generation algorithm may overspecify the requirements at the present state lines. The authors present a necessary condition that the underlying combinational test generation algorithm must satisfy to ensure a correct sequential ATPG program. It is shown that the simple D-algorithm satisfies this condition while PODEM and the enhanced D-algorithm do not. The impact of overspecification on the length of the generated test sequence is also studied. Overspecification causes a longer test sequence. Experimental results are presented.>