Clustering based identification of faulty ICs using I/sub DDQ/ tests
S. Jandhyala, H. Balachandran, S.M. Menon, Anura P. Jayasumana · 2002
Technological advances in design and process have led to questions being raised about the applicability of I/sub DDQ/ testing. The main concern is the inability to differentiate between normal and faulty quiescent currents in ICs. In this paper, we propose a new methodology aimed at addressing this concern through the application of clustering techniques to identify ICs with abnormal I/sub DDQ/ values. Preliminary results of applying this technique in production test are also presented.