Graph partitioning for concurrent test scheduling in VLSI circuit
Chien‐In Henry Chen · 1991
ModemVLSI circuits with extensive built-in self-test (JUST) resources have the problem of long testing time if the testing for the different parts of the circuits are executed successively.Herein, we present a heuristic solution, called Weighted Cluster Partitwning (WCP), to the problem of long testing time for VLSI circuits.Some of the techniques in current use exploit parallelism in testing VLSI circuits, but the computation is quite expensive.Our solution is a more efficient and effective procedure which explores the space of concurrent test schedule and leads to a considerable reduction of testing time by suitable incorporation of BIST in the circuit.