Built-in self-test with weighted random pattern hardware
F. Brglez, G. Gloster, Gershon Kedem · 2002
The authors address scan-based built-in self-test (BIST) of digital circuits that are highly resistant to testing with uniform random patterns. Introducing a procedure, the precompute test patterns for random-pattern resistant faults and generate optimized distributions of weights that guarantee pattern coverage in a given number of random trials. The software implementation offers a tradeoff in the number of distributions (hardware memory) and the length of the total test time. The hardware implementation is based on a canonic weighting circuit that interfaces to a circulating memory and a pseudo-random source.>