Reduction of SOC test data volume, scan power and testing time using alternating run-length codes
Anshuman Chandra, Krishnendu Chakrabarty · Proceedings - ACM IEEE Design Automation Conference · 2002
We present a test resource partitioning (TRP) technique that simultaneously reduces test data volume, test application time and scan power. The proposed approach is based on the use of alternating run-length codes for test data compression. Experimental results for the larger ISCAS-89 benchmarks and an IBM production circuit show that reduced test data volume, test application time and low power scan testing can indeed be achieved in all cases.