A probabilistic testability measure for delay faults
Wen Ching Wu, Chung Len Lee · 1991
This paper firstly studies gate delay fault dominance relationships for the nortrobust and robust testings and presents fault collapsing procedures.A testability measure, based on a probability model, for the delay faults both for the nonrobust and the robust testings are proposed for combinational circuits and for sequential circuits.A program has been implemented based on the measure and applied to ISCAS benchmark circuits to estimate the fault coverages.The results are in good agreement with the experimental results obtained through fault simulation.I.