A review of fault models for lsi/vlsi devices
Shan Gai, Marco Mezzalama, P. Prinetto · PORTO Publications Open Repository TOrino (Politecnico di Torino) · 1983
The review paper deals with problems concerning fault modelling for LSI/VLSI devices. Both random and regular logic are considered, and different fault classes are discussed for each, including stuck-at, bridging, functional and time-dependent faults. Specific fault models are then considered for microprocessors, RAMs and PLAs