Random testability analysis: comparing and evaluating existing approaches
Paolo Enrico Camurati, P. Prinetto, Matteo Sonza Reorda · 2003
The authors present a comparative approach to some testability analysis methods for application to VLSI devices. Using a common framework of implementations and test cases, they compared the results between analysis methods and with those provided by fault simulation or exact calculation where possible. The methods dealt with are the weighted averaging algorithm, COP, the cutting algorithm, Stafan, and Predict.>