Yield gain with memory BISR — a case study
Maddumage Karunaratne, Bejoy Oomann · 2009
We applied a BIST soft repair scheme to embedded memories using redundant data columns. We obtained yield and defect data from commercial silicon parts, and explored possible yield improvements with only a single bit repair. We implemented it on a chip with 90 memories and process margins were changed to obtain split lots to validate the repair scheme.