Test system for device drivers of embedded systems
Yu‐Seung Ma, Chaedeok Lim · 2006 8th International Conference Advanced Communication Technology · 2006
Device drivers are difficult to write and error-prone and thus constitutes the main portion of system failures. Therefore, to ensure that device drivers can run properly, their qualities have to be assured. In this paper, we suggested an architecture of a test system for device drivers. This architecture is designed to reflect embedded systems whose resources are usually limited. We also propose a reusable test case generation method for device drivers. We hope our method reduces the high cost of testing device drivers.