Technique of LFSR based test generator synthesis for deterministic and pseudorandom testing
Sergey G. Mosin, Natalia V. Chebykina, Maria S. Serina · International Conference on Experience of Designing and Applications of CAD Systems in Microelectronics · 2011
The structure of test system based on application built-in self-test (BIST) circuitries has been proposed. The main idea is oriented on minimization of hardware overheads and dealt with automatization of BIST-circuitries generation. Test generator based on linear feedback shift register (LFSR) provides two types of testing - pseudorandom and deterministic. The proposed modified Berlekamp-Massey algorithm is used for generation the LFSR polynomial coefficients. The experimental results of technique application for some ISCAS'89 benchmark circuits have been shown.