Test generation in a parallel processing environment
S.J. Chandra, Janak H. Patel · 2003
The availability of low-cost, high-performance, general-purpose parallel machines has made parallel processing viable for the development of CAD (computer-aided design) applications. The authors identify the key issues that surface when an attempt is made to parallelize the test-generation process. They illustrate how different test-generation strategies can be mapped onto different classes of parallel machines, including loosely coupled distributed systems, distributed-memory systems with message-passing architectures, and tightly coupled multiprocessor systems with shared global memory. Parallel test generation using a single heuristic and using multiple heuristics is considered. The performance of these mapping strategies is predicted by using uniprocessor turnaround times and an estimate of the communication delays.>