The Development of CCD Analog TV Line Stores
J.N. Gooding, Paul Paddan, V.A. Browne · IEEE Journal of Solid-State Circuits · 1981
This correspondence discusses the development of analog TV line stores with very low spatial noise and wide signal bandwidth. These devices are fabricated on a buried n-channel silicon gate process which exhibits low thermal leakage and low leakage spike density. A 768-stage and an 850-stage store have been designed. The problems which have been encountered during the development and their solutions are described.