Statistical timing analysis with two-sided constraints
Khaled R. Heloue, Farid N. Najm · 2005
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a device file setting that takes into account within-die statistical variations, and with which to run traditional static timing analysis in order to meet the desired yield. Using process-specific generic representing critical paths in a given process technology, our approach can be used early in the design process, most importantly during the pre-placement phase. Within-die variations are taken care of using a simple model that assumes positive correlation, which leads to upper and lower bounds on the timing yield. Our approach also handles both setup and hold timing constraints.