Diagnosis of open defects in FPGA interconnect
Mehdi Baradaran Tahoori · 2003
In this paper, we present coarse-grain and fine-grain diagnosis techniques to identify a faulty element in FPGA interconnects. The fault model we use is stuck-open and resistive-open for interconnects. The presented technique requires only a small number of configurations while offering high resolution diagnosis. We implemented this technique on real FPGA chips and verified it using fault emulation.