Regression simulation: applying path-based learning in delay test and post-silicon validation
Li-C. Wang · 2004
This paper presents a novel path-based learning methodology to achieve timing Regression Simulation. The methodology can be applied for two purposes: (1) In pre-silicon phase, regression sim-ulation can be used to produce a fast and approximate timing sim-ulator to avoid the high cost associated with statistical timing sim-ulation. (2) In post-silicon phase, regression simulation can be used as a vehicle to deduce critical paths from the pass/fail behav-ior observed on the test chips. Our path-based learning method-ology consists of four major components: a delay test pattern set, a logic simulator, a set of selected paths as the basis for learn-ing, and a machine learner. We summarize the key concepts in our regression simulation approach and present experimental results. 1.