Is test power reduction through X-filling good enough?
F. Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, S. Pravossoudovitch, A. Virazel, Mark Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, N. Ahmed · 2010
This study investigates the reasons why test power reduction through X-filling techniques works well for cycle-average power reduction but is not so efficient concerning instantaneous peak power reduction.