The LEMMA developer's toolbox: semi-automated test development for analog and mixed-signal circuits
Michael Peter Kennedy, P. Grogan, John J. O’Donnell, T. G. O'Dwyer, A. Wrixon · 2002
Analog test represents an increasing fraction of the cost of producing analog and mixed-signal integrated circuits. While digital testing can focus on identifying spot defects in a systematic manner, analog functional testing requires very precise and accurate measurements. Pessimistic forecasts suggest that "in the next few years the total product cost of a mixed-signal device will be almost entirely due to the cost of the analog tests." The LEMMA method is a model-based approach to minimizing the analog test effort by identifying a robust minimum set of testpoints.