A BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC
M.F. Toner, Gordon Walter Roberts · 2002
Built-in-self-test (BIST) for VLSI systems is desirable for production-time testing and in the field diagnostics. This paper discusses a Mixed Analog Digital BIST (MADBIST) for a frequency response test and an intermodulation distortion test of an Analog-to-Digital converter. The MADBIST strategy for the FR and IMD tests of the ADC is introduced, accuracy issues are discussed, and preliminary experimental results are presented.>