Pseudo-Exhaustive Built-in Self-Testing of Signal Integrity for High-Speed SoC Interconnects
J. Liu, Wen B. Jone, S.R. Das · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 2007
As technology approaches deep sub-micron technology and clock frequency approaches Giga Hertz, the signal integrity problem of the high speed interconnect is becoming a more and more serious issue. In this paper, we propose a pseudo-exhaustive testing scheme for signal integrity faults of high speed SoC interconnects.