Implementation of hierarchical design for testability methodology
Yansheng Zhang, Chen Jianhui, Jin Jianhui · 2009
A comprehensive test strategy initiated as early into the design cycle as possible can yield significant improvement in test coverage, faster fault diagnosis, lowered test and development costs, shorter system development time, and faster time to market. One means of improving the testability of systems is to adopt a structured, hierarchical design methodology, and a corresponding hierarchical test methodology. This paper would introduce the implementation of hierarchical design for testability (DFT) methodology from three ways: hierarchical structure, hierarchical test buses based on MIL-STD-1553B, IEEE 1149.5, and IEEE 1149.1, and concurrent test engineering.