A bayesian reliability analysis model by two debuggers for discrete‐type software and its applications
Hiroaki Sandoh, Susumu Fujii, Tatsuya Yamawaki · Electronics and Communications in Japan (Part III Fundamental Electronic Science) · 1990
Abstract This paper considers the software which is used discretely with regard to time, such as the usual software for numerical computation, and proposes a model for the reliability analysis in the development stage. Also, the case of the software test is considered in which two debuggers attempt to detect the bugs in the software. A discussion is made from the viewpoint of Bayes' theory. The case of two debuggers is as follows. Two software engineers execute the test independently for the same software. The detected bugs are compared later, including their overlaps, to acquire a larger amount of information. Based on the model for analysis proposed in this paper, a formulation is presented for the determination of the release of the software, i.e., the time to terminate the test. Numerical examples are presented, providing discussions on the features of the model considered in this study as well as on its usefulness.