The value of statistical testing for quality, yield and test cost improvement
Robert Madge, Brady Benware, M. Ward, Robert Daasch · 2006
This paper is the third in a lecture series on statistical analysis of semiconductor test data. Statistical test methods offer increased value in IC manufacturing and test over traditional maverick silicon screening methods by optimizing the trade-off between yield and reliability in deep sub-micron CMOS technologies. Effective use of the vast volume of data generated by test can lead to cost-effective screening of subtle defects, burn-in reduction or elimination and test cost reduction through adaptive test