Reasoning from uncertain data: a bit enhancement
L.J. Cooper, David Edward Smith · 2003
It is proposed that artificial intelligence (AI) principles, coupled with powerful Bayesian statistical inference techniques, can be successfully applied to built-in-test (BIT) technology and can significantly contribute to the improvement of avionics BIT diagnostic capabilities. The goal is to extract more information from available data provided by the BIT, rather than to expand its testing capabilities. The proposed approach is illustrated by a TACAN (tactical air navigation) example.>