A 1 Gb/s deskew IC for RAMBUS automatic test application
A. Hendarman, A. Choudhury, A. Yousefi, A.L. Armstrong · 2002
A deskew IC has been designed and fabricated using a 0.5-/spl mu/m GaAs E/D MESFET process. This IC is part of a five-chip chipset used in automatic test equipment for RAMBUS devices and currently shipping in a high-volume. The packaged IC consumes roughly 1/4 the board area and 1/2 the power of the bipolar alternative, allowing the entire high-speed section of a 32-DUT RAMBUS tester to fit in the test head. This paper describes the tester system architecture, circuit design techniques, and measured results of the deskew IC.