A BIST scheme for a SNR, gain tracking, and frequency response test of a sigma-delta ADC
M.F. Toner, Gordon Walter Roberts · IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 1995
Built-in-self test (BIST) for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means to perform in-the-field diagnostics. This paper discusses a mixed analog-digital BIST (MADBIST) for a signal-to-noise-ratio test, gain tracking test, and frequency response test of a sigma-delta analog-to-digital converter. The MADBIST strategy for the SNR, GT, and FR tests of the ADC is introduced, accuracy issues are discussed, and experimental results are presented.>