Analog-testability analysis by determinant-decision-diagrams based symbolic analysis
Tao Pi, C.‐J. Richard Shi · 2000
The use of the column-rank of the sensitivity matrix as a testability measure for parametric faults in linear analog circuits was pioneered by Saeks in 1970s, and later re-discovered by several others.Its practical use has been, however, limited by how it can be calculated.Numerical algorithms suffer from inevitable round-off errors, while classical symbolic techniques can only handle very small circuits.In this paper , an innovative and efficient graph based symbolic analysis approach, called Determinant Decision Diagrams, is applied to testability measurement and selection for optimum test vectors.The new approach is promising in testability analysis of much larger analog circuits.