Structural approach for built-in tests in RF devices
Deepa Mannath, Dallas Webster, Victor Montaño-Martinez, David Avery Cohen, Shai Kush, Ganesan Thiagarajan, Adesh Sontakke · 2010
Production testing of today's RF SoCs does not require expensive conventional tests. We propose a set of defect based tests for the RF/Analog sections, based on our analysis of defects that occur in a modern RFCMOS process.