Input pattern classification for detection of stuck-ON and bridging faults using I/sub DDQ/ testing in BiCMOS and CMOS circuits
S.M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana · 2002
Quiescent power supply current monitoring (I/sub DDQ/) has been shown to be effective for testing CMOS devices. BiCMOS is emerging as a major technology for high speed, high performance, digital and mixed signal applications. Stuck-ON faults as well as bridging faults in BiCMOS circuits cause enhanced I/sub DDQ/. An input pattern classification scheme is presented for detection of stuck-ON/bridging faults causing enhanced I/sub DDQ/. This technique can also be used for detecting I/sub DDQ/ related faults in CMOS circuits.