Design and implementation of a BISD scheme
Xiaoling Sun, D. Ellert · 2002
This paper describes the design and implementation of a novel built-in self-diagnosis (BISD) scheme for IC-level scan-based circuits. The proposed scheme is capable of identifying all flip-flops that have captured erroneous circuit responses during a test, independent of the number of errors in the circuit response sequences and the number of defects in a circuit.