Combating digital noise in high speed ULSI circuits using binary BCH encoding
Dinesh Pamunuwa, Li‐Rong Zheng, Hannu Tenhunen · 2002
Increased integration in deep submicron (DSM) technologies has caused very high increases in the RLC parasitics which affect the coupling of noise to signals propagating over interconnect. Error free transmission on-chip will no longer be guaranteed, This paper examines the issue of high speed signaling in DSM and proposes the use of particular BCH codes to improve the bit error rate in the face of noise. We conclude from our results that it is possible to achieve a considerable coding gain by choosing the code properly.