Equivalence Checking Using Independent Cuts.
Zhan Xu, Xiaolang Yan, Yongjiang Lu, GE Hai-tong · Asian Test Symposium · 2003
With the increase in the complexity of present day systems, proving the correctness of a design has become a major concern. This paper describes a novel implementation of a BDD-based Combinational Equivalence Checking (CEC) tool, which distinguishes from others by one heuristic. It is proposed to select effective cut, with no dependence remaining. In addition, successfully verification of all the ISCAS’85 benchmark circuits demonstrates the efficiency of our approach.