Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems
George J. Starr, Jie Qin, Bradley F. Dutton, Charles E. Stroud, Fa Foster Dai, Victor P. Nelson · 2009
This paper presents a software based approach for automatic generation of digital circuitry for synthesis and incorporation in a mixed-signal circuit or system to provide built-in self-test (BIST) and measurement of the analog circuitry. The measurements supported by the BIST circuitry include frequency response (both gain and phase), linearity and noise figure. The measurements provide analog functional testing as well as the basis for on-chip compensation to improve yield during manufacturing and performance during system operation.