Integrating Robust Technologies for Mixed-Signal System Level Test
Andres Mellik · 2006
An automated system-level test model approach is introduced, incorporating XML, while making use of interchangeable virtual instruments (IVI) and Automatic Test Markup Language (ATML) standards. Integrating basic block models into an automated test framework, targeting specifically mixed-signal ICs, the focus is on abstraction through integrating proven technologies in growing complexity levels. Initial research shows high potential for parallel development of system-level design and test models, thus reducing total production time