Mismatch simulation for layout sensitive parameters of IC components and devices
Gerhard Tröster, P. Tomaszewski · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1989
A compact Monte-Carlo-based universal procedure is presented that allows the estimation and qualification of geometrical arrangements and matching strategies, especially in monolithic devices. On the basis of a simple circuit example, the general structure of the main algorithm is explained, and some extensions are discussed. Experimental results on different configurations illustrate the broad application range.>