I/sub DDQ/ measurement based diagnosis of bridging faults in full scan circuits
S. Chakravarty, Sudha Suresh · 2002
An algorithm for diagnosing two node bridging faults in static CMOS combinational circuits (full scan circuits) is presented. This algorithm uses results from I/sub DDQ/ testing. The bridging faults considered can be between nodes that are outputs of a gate or internal nodes of gates. Experiments on ISCAS89 circuits show that: I/sub DDQ/ measurement based diagnosis, using a small number of random vectors, is very effective; and it is computationally feasible to diagnose, using I/sub DDQ/ measurement, the large number of all bridging faults.>