On undetectable faults in partial scan circuits
Irith Pomeranz, Sudhakar M. Reddy · Digest of technical papers/Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design · 2002
We provide a definition of undetectable faults in partial scan cir-cuits under a test application scheme where a test consists of pri-mary input vectors applied at-speed between scan operations. We also provide sufficient conditions for a fault to be undetect-able under this test application scheme. We present experimen-tal results on finite-state machine benchmarks to demonstrate the effectiveness of these conditions in identifying undetectable faults. 1.