Invited paper. Algorithms for functional testing of digital systems†
Fabrizio Lombardi, C.-L. Wey · International Journal of Electronics · 1987
In this paper, a novel functional model is presented. This functional model is based on a Iarge-scale dynamical characterization of a multi-unit digital system in which test results can be invalidated. Two algorithms are presented. The first algorithm is applicable to the diagnosis of a system with only a single fault and requires a Iower number of execution steps than similar algorithms. This algorithm is exact. A new heuristic algorithm is proposed for multiple faults. Conditions for the nonsequential execution of the algorithms are analysed; a covering set approach is proposed as the basis for a parallel process. The parallel process uses an adaptive diagnostic criterion to establish the validity of the test results by progressive refinement. Using a Steiner system characterization, it is proved that the proposed parallel techniques offer significant advantages over a sequential execution. A novel architecture for the diagnostic system is proposed; this architecture exploits the parallel nature of the algorithm to reduce on-line computation.