Diagnostic simulation of stuck-at faults in combinational circuits
Sourish Chakravarty, Yunpeng Gong · 2002
Two faults are said to be equivalent, w.r.t. a test set T, iff they cannot be distinguished by any test in T. The sizes of the equivalence classes are used as a basis for comparing the diagnostic capability of two given test sets. The authors show that modifications of single stuck-at fault simulators leads to very efficient diagnostic simulators when compared with those reported in the literature.>