Research of fractal thick-film elements frequency responses
Pyotr A. Ushakov, Cyril O. Maksimov, А. В. Филиппов · 2010
The results of frequency responses measurements of two-terminal thick-film elements on the basis of RC-elements with distributed parameters with fractal impedance are presented. The given elements were synthesized for implementation of constant phase input impedance on level φv= 36.5° ± 2.5° (frequency scale v = 0.4 ± 0.03) over the 2.5-decade operating frequency range. The thick-film element construction and the used materials of layers are represented. The statistical estimation of input impedance phase-frequency response (PFR) parameters of the experimental samples is carried out. It is shown that measured PFR parameters well coincide with a synthesis preset PFR parameters, but have a narrower phase persistence frequency band. The reasons for difference of the experimental performance from the theoretical one are defined by circuit simulation. The tasks, solution to which will allow to create elements with the fractal impedance preset parameters of the fractional order integration and derivation devices, are set.