A Built-In-Test Circuit for RF Differential Low Noise Amplifiers
L. Dermentzoglou, Angela Arapoyanni, Yiorgos E. Tsiatouhas · IEEE Transactions on Circuits and Systems I Regular Papers · 2010
This paper presents an efficient, low-cost, built-in test (BIT) circuit for radio frequency differential low noise amplifiers (DLNAs). The BIT circuit detects amplitude alterations at the outputs of the DLNA, due to parametric or catastrophic faults, and provides a single digital Pass/Fail indication signal. A triple modular redundancy approach has been adopted for the BIT circuit design to avoid possible yield loss in case of a malfunctioning test circuitry. The technique has been evaluated on a typical CMOS RF DLNA and simulation results are presented.