Fault diagnosis of analog circuits with tolerances using artificial neural networks
Ying Deng, Yigang He, Yichuang Sun · 2002
This paper proposes a method for analog fault diagnosis using neural networks. The primary focus of the paper is to provide robust diagnosis using a mechanism to deal with the problem of component tolerances and reduce testing time. The proposed approach is based on the k-fault diagnosis method and artificial backward propagation neural network. Simulation results show that the method is robust and fast for fault diagnosis of analog circuits with tolerances.