Testable switched-capacitor filters
J.L. Huertas, Adoracion Rueda, Diego Vazquez · IEEE Journal of Solid-State Circuits · 1993
A design-for-testability (DFT) methodology for switched-capacitor (SC) filters is presented, based on an architecture using some additional circuitry and providing extra capabilities for both off- and online test. A programmable biquad is used for on-chip comparison of the transfer functions for every filter stage. Test area overhead consists of the programmable biquad, a set of switches, and a finite-sequential-machine (FSM) control part. The design and implementation of an example filter are included to assess the potential usefulness of this approach.>